Welcome to the homepage of the Appalachian Regional Microscopy Society (AReMS)

AReMS is a regional affliliate of the Microscopy Society of America (MSA) and the Microbeam Analysis Society (MAS)

AReMS is a society of scientists, engineers, educators, professionals and students with interests in microscopy of any type including optical, electron, ion and scanned probe microscopies.

AReMS meets annually with an invigorating program of technical talks, vendor displays, work shops and social activities.

Please join us at the next AReMS meeting on October 15 & 16, 2009. Click here for more info.

KEYNOTE SPEAKER: Ged Moody, Sustainability Director, Appalachian State University

INVITED TALKS:

Chad Parish, Oak Ridge National Labs: Quantitative STEM-EDS Mapping and Analysis

Libby Puckett, AppState Chemistry: Forensic Microscopy

Guichuan Hou, AppState Dewel Microscopy Facility, Confocal Microscopy: An Elegant Tool For Modern Biological Research

Louis T. Germinario, LG Analytical, Atomic-Scale STEM Imaging of Catalyst Clusters at Catalytic Temperatures

Kevin Mcilwrath, Hitachi High Technology, Tomography: a 3D imaging analytical perspective

Maxim Nikiforov, Oak Ridge National Labs Thermo/Mechanical analysis of polymeric materials with high spatial resolution: from curves to numbers

Anuj Dhawan, Duke University, Development and applications of Plasmonic Devices

Poster presentations:
Isaac Bryan: "Analysis of Wear Patterns on Neanderthal Stone Tools" 

Zachary Bryan: "New Learning Modules for Atomic Force 
Microscopy"
Patty Elkins: “Ion Beam Induced Deposition: Parameters & Characterization”
David Monroe: “Materials Characterization of Direct Methanol Fuel Cells”
Maxim Nikiforov: “Mapping Mechanical Properties and Glass Transition Temperature in Polymer Materials with sub-100 nm Resolution.”
M.P. Nikiforov , S. Gam, S. Jesse, L.T. Germinario, R.C. Composto, and S.V. Kalinin:
Zach Russell:

 

Annual Dues

Student - $5

Individual - $10

Corporate - $20