AppNano
Instruments: Veeco Dimension Icon SPM
X-Y scan range, Z range
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90μm x 90μm, 10μm in imaging and force curve modes, 9.5μm minVertical
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Vertical noise floor, xy position noise
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<30pm RMS imaging BW (625Hz), 0.15nm RMS imaging BW (625Hz) in closed-loop;0.10nm RMS imaging BW (625Hz) in open-loop
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Max image pixel size
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5120 x 5120
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Available Modes
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Conductive AFM Option (C-AFM), Contact Mode Electrostatic Force Microscopy (EFM), Force Modulation Microscopy (FMM), Force Volume Force-Distance Measurements, HarmoniX Imaging Mode, Lateral Force Microscopy (LFM), Magnetic Force Microscopy (MFM), Nanoindenting/Scratching, PhaseImaging™ ,Scanning Capacitance Microscopy (SCM), Scanning Tunneling Microscopy (STM), Torsion Resonance Mode (TRmode) Torsional Resonance, Tunneling AFM (TR TUNA), Tunneling AFM (TUNA)
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